An efficient test vector generation for checking analog/mixed-signal functional models - researchr publication authors

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Byong Chan Lim, Jaeha Kim, Mark A. Horowitz. An efficient test vector generation for checking analog/mixed-signal functional models. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 767-772, ACM, 2010. [doi]

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