Byong Chan Lim, Jaeha Kim, Mark A. Horowitz. An efficient test vector generation for checking analog/mixed-signal functional models. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 767-772, ACM, 2010. [doi]
@inproceedings{LimKH10,
title = {An efficient test vector generation for checking analog/mixed-signal functional models},
author = {Byong Chan Lim and Jaeha Kim and Mark A. Horowitz},
year = {2010},
doi = {10.1145/1837274.1837468},
url = {http://doi.acm.org/10.1145/1837274.1837468},
tags = {model checking, meta-model, testing, Meta-Environment},
researchr = {https://researchr.org/publication/LimKH10},
cites = {0},
citedby = {0},
pages = {767-772},
booktitle = {Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010},
editor = {Sachin S. Sapatnekar},
publisher = {ACM},
isbn = {978-1-4503-0002-5},
}