Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis

Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang 0001. Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs, 71(4):2024-2028, April 2024. [doi]

Authors

Hyeonchan Lim

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Tae-Hyun Kim

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Sungho Kang 0001

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