Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang 0001. Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs, 71(4):2024-2028, April 2024. [doi]
@article{LimKK24-0,
title = {Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis},
author = {Hyeonchan Lim and Tae-Hyun Kim and Sungho Kang 0001},
year = {2024},
month = {April},
doi = {10.1109/TCSII.2023.3332082},
url = {https://doi.org/10.1109/TCSII.2023.3332082},
researchr = {https://researchr.org/publication/LimKK24-0},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. II Express Briefs},
volume = {71},
number = {4},
pages = {2024-2028},
}