Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis

Hyeonchan Lim, Tae-Hyun Kim, Sungho Kang 0001. Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs, 71(4):2024-2028, April 2024. [doi]

Abstract

Abstract is missing.