SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dae-ui Lim, Young-Gyu Kim, Tae Hyoung Park. SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network. In 3rd IEEE International Conference on Robotic Computing, IRC 2019, Naples, Italy, February 25-27, 2019. pages 395-398, IEEE, 2019. [doi]

This author has not been identified. Look up 'Dae-ui Lim' in GoogleThis author has not been identified. Look up 'Young-Gyu Kim' in GoogleThis author has not been identified. Look up 'Tae Hyoung Park' in Google

runs on WebDSL