Dae-ui Lim, Young-Gyu Kim, Tae Hyoung Park. SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network. In 3rd IEEE International Conference on Robotic Computing, IRC 2019, Naples, Italy, February 25-27, 2019. pages 395-398, IEEE, 2019. [doi]
@inproceedings{LimKP19,
title = {SMD Classification for Automated Optical Inspection Machine Using Convolution Neural Network},
author = {Dae-ui Lim and Young-Gyu Kim and Tae Hyoung Park},
year = {2019},
doi = {10.1109/IRC.2019.00072},
url = {https://doi.org/10.1109/IRC.2019.00072},
researchr = {https://researchr.org/publication/LimKP19},
cites = {0},
citedby = {0},
pages = {395-398},
booktitle = {3rd IEEE International Conference on Robotic Computing, IRC 2019, Naples, Italy, February 25-27, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9245-5},
}