J.-H. Lim, N. Raghavan, J. H. Kwon, T.-Y. Lee, R. Chao, N. L. Chung, K. Yamane, N. Thiyagarajah, V. B. Naik, K. L. Pey. Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.