Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs

Jae-Won Lim, Changhyun Yoo, Kiron Park, Jongwook Jeon. Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs. IEEE Access, 11:82208-82215, 2023. [doi]

Authors

Jae-Won Lim

This author has not been identified. Look up 'Jae-Won Lim' in Google

Changhyun Yoo

This author has not been identified. Look up 'Changhyun Yoo' in Google

Kiron Park

This author has not been identified. Look up 'Kiron Park' in Google

Jongwook Jeon

This author has not been identified. Look up 'Jongwook Jeon' in Google