Jae-Won Lim, Changhyun Yoo, Kiron Park, Jongwook Jeon. Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs. IEEE Access, 11:82208-82215, 2023. [doi]
@article{LimYPJ23,
title = {Self-Heating and Corner Rounding Effects on Time Dependent Dielectric Breakdown of Stacked Multi-Nanosheet FETs},
author = {Jae-Won Lim and Changhyun Yoo and Kiron Park and Jongwook Jeon},
year = {2023},
doi = {10.1109/ACCESS.2023.3297493},
url = {https://doi.org/10.1109/ACCESS.2023.3297493},
researchr = {https://researchr.org/publication/LimYPJ23},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {11},
pages = {82208-82215},
}