Sheng-Chih Lin, Kaustav Banerjee. An electrothermally-aware full-chip substrate temperature gradient evaluation methodology for leakage dominant technologies with implications for power estimation and hot-spot management. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 568-574, ACM, 2006. [doi]
Abstract is missing.