Test effectiveness evaluation through analysis of readily-available tester data

Yen-Tzu Lin, Ronald D. Blanton. Test effectiveness evaluation through analysis of readily-available tester data. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]

Authors

Yen-Tzu Lin

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Ronald D. Blanton

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