Yen-Tzu Lin, Ronald D. Blanton. Test effectiveness evaluation through analysis of readily-available tester data. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
@inproceedings{LinB09-4, title = {Test effectiveness evaluation through analysis of readily-available tester data}, author = {Yen-Tzu Lin and Ronald D. Blanton}, year = {2009}, doi = {10.1109/TEST.2009.5355716}, url = {http://dx.doi.org/10.1109/TEST.2009.5355716}, researchr = {https://researchr.org/publication/LinB09-4}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009}, editor = {Gordon W. Roberts and Bill Eklow}, publisher = {IEEE}, isbn = {978-1-4244-4868-5}, }