Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala. Innovative practices session 2C: Advanced in yield learning. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
@inproceedings{LinBSB14,
title = {Innovative practices session 2C: Advanced in yield learning},
author = {Yen-Tzu Lin and Brady Benware and Brian Stine and Azeez Bhavnagarwala},
year = {2014},
doi = {10.1109/VTS.2014.6818749},
url = {http://dx.doi.org/10.1109/VTS.2014.6818749},
researchr = {https://researchr.org/publication/LinBSB14},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014},
publisher = {IEEE},
}