Innovative practices session 2C: Advanced in yield learning

Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala. Innovative practices session 2C: Advanced in yield learning. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]

Abstract

Abstract is missing.