Qian Lin, Qian-Fu Cheng, Jun-jie Gu, Yuanyuan Zhu, Chao Chen, Haipeng Fu. Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier. J. Electronic Testing, 32(2):235-240, 2016. [doi]
@article{LinCGZCF16,
title = {Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier},
author = {Qian Lin and Qian-Fu Cheng and Jun-jie Gu and Yuanyuan Zhu and Chao Chen and Haipeng Fu},
year = {2016},
doi = {10.1007/s10836-016-5571-7},
url = {http://dx.doi.org/10.1007/s10836-016-5571-7},
researchr = {https://researchr.org/publication/LinCGZCF16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {2},
pages = {235-240},
}