Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs - researchr publication authors

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Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu. Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

This author has not been identified. Look up 'Chen-Wei Lin' in GoogleThis author has not been identified. Look up 'Mango Chia-Tso Chao' in GoogleThis author has not been identified. Look up 'Chih-Chieh Hsu' in Google

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