Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu. Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{LinCH13,
title = {Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs},
author = {Chen-Wei Lin and Mango Chia-Tso Chao and Chih-Chieh Hsu},
year = {2013},
doi = {10.1109/VTS.2013.6548929},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548929},
researchr = {https://researchr.org/publication/LinCH13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}