Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz. On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. In 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. pages 103-108, IEEE, 2021. [doi]
Abstract is missing.