On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults - researchr publication

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Xijiang Lin, Wu-Tung Cheng, Janusz Rajski. On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 97-102, IEEE, 2015. [doi]

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