A novel key-variable sifting algorithm for virtual metrology

Tung-Ho Lin, Fan-Tien Cheng, Aeo-Juo Ye, Wei-Ming Wu, Min-Hsiung Hung. A novel key-variable sifting algorithm for virtual metrology. In 2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA. pages 3636-3641, IEEE, 2008. [doi]

@inproceedings{LinCYWH08,
  title = {A novel key-variable sifting algorithm for virtual metrology},
  author = {Tung-Ho Lin and Fan-Tien Cheng and Aeo-Juo Ye and Wei-Ming Wu and Min-Hsiung Hung},
  year = {2008},
  doi = {10.1109/ROBOT.2008.4543768},
  url = {http://dx.doi.org/10.1109/ROBOT.2008.4543768},
  researchr = {https://researchr.org/publication/LinCYWH08},
  cites = {0},
  citedby = {0},
  pages = {3636-3641},
  booktitle = {2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA},
  publisher = {IEEE},
}