Tung-Ho Lin, Fan-Tien Cheng, Aeo-Juo Ye, Wei-Ming Wu, Min-Hsiung Hung. A novel key-variable sifting algorithm for virtual metrology. In 2008 IEEE International Conference on Robotics and Automation, ICRA 2008, May 19-23, 2008, Pasadena, California, USA. pages 3636-3641, IEEE, 2008. [doi]
Abstract is missing.