Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton. Physically-Aware N-Detect Test Relaxation. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 197-202, IEEE Computer Society, 2009. [doi]
@inproceedings{LinEB09,
title = {Physically-Aware N-Detect Test Relaxation},
author = {Yen-Tzu Lin and Chukwuemeka U. Ezekwe and Ronald D. Blanton},
year = {2009},
doi = {10.1109/VTS.2009.47},
url = {http://dx.doi.org/10.1109/VTS.2009.47},
tags = {testing, context-aware},
researchr = {https://researchr.org/publication/LinEB09},
cites = {0},
citedby = {0},
pages = {197-202},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}