Yen-Tzu Lin, Chukwuemeka U. Ezekwe, Ronald D. Blanton. Physically-Aware N-Detect Test Relaxation. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 197-202, IEEE Computer Society, 2009. [doi]
Abstract is missing.