IR drop prediction of ECO-revised circuits using machine learning

Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang. IR drop prediction of ECO-revised circuits using machine learning. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]

Authors

Shih-Yao Lin

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Yen-Chun Fang

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Yu-Ching Li

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Yu-cheng Liu

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Tsung-Shan Yang

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Shang-Chien Lin

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Chien-Mo James Li

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Eric Jia-Wei Fang

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