Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang. IR drop prediction of ECO-revised circuits using machine learning. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.