Pairwise Proximity-Based Features for Test Escape Screening - researchr publication authors

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Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng. Pairwise Proximity-Based Features for Test Escape Screening. In Diana Marculescu, Frank Liu, editors, Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015, Austin, TX, USA, November 2-6, 2015. pages 300-306, ACM, 2015. [doi]

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