Fan Lin, Chun-Kai Hsu, Alberto Giovanni Busetto, Kwang-Ting Cheng. Pairwise Proximity-Based Features for Test Escape Screening. In Diana Marculescu, Frank Liu, editors, Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015, Austin, TX, USA, November 2-6, 2015. pages 300-306, ACM, 2015. [doi]
@inproceedings{LinHBC15,
title = {Pairwise Proximity-Based Features for Test Escape Screening},
author = {Fan Lin and Chun-Kai Hsu and Alberto Giovanni Busetto and Kwang-Ting Cheng},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2840862},
researchr = {https://researchr.org/publication/LinHBC15},
cites = {0},
citedby = {0},
pages = {300-306},
booktitle = {Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015, Austin, TX, USA, November 2-6, 2015},
editor = {Diana Marculescu and Frank Liu},
publisher = {ACM},
isbn = {978-1-4673-8389-9},
}