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Chen-Wei Lin, Chin-Yuan Huang, Mango Chia-Tso Chao. Testing of a low-VMIN data-aware dynamic-supply 8T SRAM. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]