Chen-Wei Lin, Chin-Yuan Huang, Mango Chia-Tso Chao. Testing of a low-VMIN data-aware dynamic-supply 8T SRAM. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{LinHC13,
title = {Testing of a low-VMIN data-aware dynamic-supply 8T SRAM},
author = {Chen-Wei Lin and Chin-Yuan Huang and Mango Chia-Tso Chao},
year = {2013},
doi = {10.1109/VTS.2013.6548895},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548895},
researchr = {https://researchr.org/publication/LinHC13},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}