AdaTest: An efficient statistical test framework for test escape screening

Fan Lin, Chun-Kai Hsu, Kwang-Ting Cheng. AdaTest: An efficient statistical test framework for test escape screening. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-8, IEEE, 2015. [doi]

Abstract

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