Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS technologies - researchr publication authors

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Chin-Yu Lin, Yen-Chuan Huang, Tai-Cheng Lee. Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS technologies. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]

This author has not been identified. Look up 'Chin-Yu Lin' in GoogleThis author has not been identified. Look up 'Yen-Chuan Huang' in GoogleThis author has not been identified. Look up 'Tai-Cheng Lee' in Google

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