Chin-Yu Lin, Yen-Chuan Huang, Tai-Cheng Lee. Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS technologies. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]
No references recorded for this publication.
No citations of this publication recorded.