Overcoming post-silicon validation challenges through quick error detection (QED) - researchr publication authors

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David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra. Overcoming post-silicon validation challenges through quick error detection (QED). In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 320-325, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

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