Programmable Leakage Test and Binning for TSVs

Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng. Programmable Leakage Test and Binning for TSVs. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 43-48, IEEE Computer Society, 2012. [doi]

Abstract

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