ESD protection design for I/O cells in sub-130-nm CMOS technology with embedded SCR structure - researchr publication

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Kun-Hsien Lin, Ming-Dou Ker. ESD protection design for I/O cells in sub-130-nm CMOS technology with embedded SCR structure. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 1182-1185, IEEE, 2005. [doi]

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