Jin-Fu Lin, Te-Chieh Kung, Soon-Jyh Chang. A Reduced Code Linearity Test Method for Pipelined A/D Converters. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 111-116, IEEE Computer Society, 2008. [doi]
@inproceedings{LinKC08-0,
title = {A Reduced Code Linearity Test Method for Pipelined A/D Converters},
author = {Jin-Fu Lin and Te-Chieh Kung and Soon-Jyh Chang},
year = {2008},
doi = {10.1109/ATS.2008.53},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.53},
researchr = {https://researchr.org/publication/LinKC08-0},
cites = {0},
citedby = {0},
pages = {111-116},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}