Exploration of Reference Trimming Schemes for STT-MRAMs

Pei Yun Lin, Jin-Fu Li 0001. Exploration of Reference Trimming Schemes for STT-MRAMs. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-4, IEEE, 2026. [doi]

Abstract

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