Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen. An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 1119, IEEE Computer Society, 2002. [doi]
Abstract is missing.