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Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng. Pseudo-Functional Scan-based BIST for Delay Fault. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 229-234, IEEE Computer Society, 2005. [doi]
Abstract is missing.