Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao. Outlier Detection for Analog Tests Using Deep Learning Techniques. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{LinLCCWC23,
title = {Outlier Detection for Analog Tests Using Deep Learning Techniques},
author = {Chin-Kuan Lin and Cheng-Che Lu and Shuo-Wen Chang and Ying-Hua Chu and Kai-Chiang Wu and Mango Chia-Tso Chao},
year = {2023},
doi = {10.1109/VTS56346.2023.10139998},
url = {https://doi.org/10.1109/VTS56346.2023.10139998},
researchr = {https://researchr.org/publication/LinLCCWC23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4630-5},
}