Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao. Outlier Detection for Analog Tests Using Deep Learning Techniques. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.