W.-A. Lin, C. C. Lee, J.-L. Huang. Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 315-320, IEEE Computer Society, 2011. [doi]
@inproceedings{LinLH11-3,
title = {Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs},
author = {W.-A. Lin and C. C. Lee and J.-L. Huang},
year = {2011},
doi = {10.1109/VTS.2011.5783740},
url = {http://dx.doi.org/10.1109/VTS.2011.5783740},
tags = {testing, source-to-source, C++, open-source},
researchr = {https://researchr.org/publication/LinLH11-3},
cites = {0},
citedby = {0},
pages = {315-320},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}