Chin-Hung Lin, Ing-Chao Lin, Kuan-Hui Li. TG-based technique for NBTI degradation and leakage optimization. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 133-138, ACM, 2011. [doi]
Abstract is missing.