Kuen-Wey Lin, Yih-Lang Li, Rung-Bin Lin. Multiple-patterning lithography-aware routing for standard cell layout synthesis. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016. pages 534-537, IEEE, 2016. [doi]
Abstract is missing.