The following publications are possibly variants of this publication:
- Adversarial robustness of deep neural networks: A survey from a formal verification perspectiveMeng, Mark Huasong, Bai, Guangdong, Teo, Sin Gee, Hou, Zhe, Xiao, Yan, Lin, Yun, Dong, Jin Song. IEEE Transactions on Dependable and Secure Computing, , 2022.
- Automated defect inspection of light-emitting diode chips using neural network and statistical approachesHong-Dar Lin. eswa, 36(1):219-226, 2009. [doi]
- Automated Industrial Inspection of LED Chips Using Multivariate Factor AnalysisHong-Dar Lin, Chung-Yu Chung, Wan-Ting Lin. ipcv 2010: 283-288
- A Compact Convolutional Neural Network for Surface Defect InspectionYibin Huang, Congying Qiu, Xiaonan Wang, Shijun Wang, Kui Yuan. sensors, 20(7):1974, 2020. [doi]
- A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED ChipsHong-Dar Lin, Chung-Yu Chung. isnn 2007: 785-792 [doi]