A testability-driven technology mapping method for optimized test point insertion

Xiaoze Lin, Liyang Lai, Biwei Xie, Xingquan Li, Huawei Li 0001. A testability-driven technology mapping method for optimized test point insertion. Integration, 110:102804, 2026. [doi]

Authors

Xiaoze Lin

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Liyang Lai

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Biwei Xie

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Xingquan Li

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Huawei Li 0001

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