Xiaoze Lin, Liyang Lai, Biwei Xie, Xingquan Li, Huawei Li 0001. A testability-driven technology mapping method for optimized test point insertion. Integration, 110:102804, 2026. [doi]
@article{LinLXLL26,
title = {A testability-driven technology mapping method for optimized test point insertion},
author = {Xiaoze Lin and Liyang Lai and Biwei Xie and Xingquan Li and Huawei Li 0001},
year = {2026},
doi = {10.1016/j.vlsi.2026.102804},
url = {https://doi.org/10.1016/j.vlsi.2026.102804},
researchr = {https://researchr.org/publication/LinLXLL26},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {110},
pages = {102804},
}