Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer. Power Aware Embedded Test. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 511-516, IEEE Computer Society, 2011. [doi]
Abstract is missing.