Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar. Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
Abstract is missing.